Features
of the equipment
·
Observation
of post-test deformation behavior, Custom-engineered enclosure with an
integrated anti-vibration system to provide nanoscale characterization
capabilities in non-ideal environments
·
Intelligently
designed software with enhanced automated testing routines and an intuitive
user interface
·
Easily
adaptable system to meet specific research needs, from soft polymers to
ceramic thin films. Etc
|
Unique
features/Measurement capabilities, if any
Ø High-resolution
in-situ SPM imaging that enables precise test positioning accuracy (±10 nm)
Ø Sensitive force and
displacement noise floors (75 nN, 0.2 nm) for unprecedented accuracy
|
Instrument
Technical Description and Major Specifications (This Specifications Limited
to Major 5)
§ Maximum force up to 10mN
§ Minimum Contact Force <100nN
§ Stage Travel 50mm x 150mm
§ Z-travel -50mm
|
Measurement/Sample
specifications:
§
Maximum
size usually limited 10mm x 10mmx10mm
§ Surface roughness must be less
than 500 nm. Porous material cannot be tested
|